Synthesis is a process of converting RTL verified code to technology-specific gate-level netlist.
Synthesis goal
- To get a gate-level netlist
- Inserting clock gates
- Logic optimization
- Inserting DFT logic
- Logic equivalence between RTL code and netlist should be maintained
Input files required for the synthesis
Tech-related files:
- .tf- technology-related information.
- .lib-timing info of standard cell & macros
Design related:
- .v- RTL code.
- SDC- Timing constraints.
- UPF- power intent of the design.
- Scan config- Scan-related info like scan chain length, scan IO, which flops are to be considered in the scan chains.
For Physical aware:
- RC co-efficient file (tluplus).
- LEF/FRAM- abstract view of the cell.
- Floorplan DEF- locations of IO ports and macros.
Synthesis steps
Analyze and Elaborate
Analyze
Checks syntax on RTL code and generates immediate files.
Elaborate
Brings all lower-level blocks into synthesis tool.
All the codes and arithmetic operators are converted into Gtech and DW (Design Ware) components. These are technology-independent libraries.
Gtech- contains basic logic gates & flops.
DesignWare- contains complex cells like FIFO, counters ect.
Elaborate performs following tasks:
- Analyses design hierarchy.
- Removes empty switches and dead branches.
- Executes initial commands.
- Detects asynchronous reset.
- Converts decision trees to mux.
- Converts synchronous to Dlatch/DFF.
- FSM pass
- Detects FSM logic and extracts the no of input, output bits, and state bits.
- Converts FSM logic to basic logic.
- Memory pass
- Merging DFF to memory write(memwr) and memory read (memrd)
- Consolidating memwr/memrd cells
- Generate memory (mem) cells
- Mapping mem cells to basic logic
Import constraints and UPF
Once the design is extracted in the form of technology-independent cells, timing constraints are imported from the SDC file.
If the design consists of multiple power domains, (voltage area) then using the UPF power domains, isolation cells, level shifters, power switches, retention flops are placed.
Clock gating
Due to the high switching activity of the clock, a lot of dynamic power is consumed. One of the techniques to lower the dynamic power is clock gating.
Compile
- Performs Boolean optimization.
- Maps all the cells to technology libraries.
- Performs logic and design optimization.
Optimization
- Logic optimization
- Constant folding
- Detect identical cells
- Optimize mux(dead branches in mux)
- consolidate mux and reduce inputs(many to single)
- Remove DFF with a constant value
- Reduce word size of the cells
- Remove unused cells and wires
- Design optimization
- Reduce TNS and WNS
- Power Optimization
- Area Optimization
- Meet the timing DRV’s
- incremental clock gating
DFT (Design for Testing) insertion
- DFT circuits are used for testing each and every node in the design.
- More the numbers of nodes that can be tested with some targeted pattern, more is the coverage.
- To get more coverage the design needs to be more controllable and observable.
- For the design to be more controllable we need more control points (mux through which alternate path is provided to propagate pattern).
- For the design to be more observable we need more observe points (A scan-able flop that observes the value at that node).
- Scan mode is used to test stuck-at faults and manufactured devices for the delay.
- Scan mode is done using scan chains
- Scan chains are part of scan-based designs to propagate the test data.
- By having scan chains, the design can be more controllable and observable.
- Each scan chain inputs the pattern through scan input and outputs the pattern through scan output.
- Scan chain consists of scan flops where the output of scan flops is directly connected to scan inputs of the flops.
Compile incremental
- Technology mapping of DFT circuit
- Optimization of the design
Outputs of Synthesis
- Gate level netlist
- SDC
- UPF
- ScanDEF
Checklist at post-synthesis
- Check if the RTL and netlist are logically equivalent (LEC/FM).
- Check if SDC and UPF are generated after synthesis and also check their completeness.
Checks related to timing
- Combinational loops
- Un-clocked registers
- unconstrained IO’s
- IO delay missing
- Un-expandable clocks
- Master-slave separation
- multiple clocks
Checks related to design
- Floating pins
- multi driven inputs
- un-driven inputs
- un-driven outputs
- normal cells in the clock path
- pin direction mismatch
- don’t use cells
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